Apertureless Near-Field Distance-Dependent Lifetime Imaging and Spectroscopy of Semiconductor Nanocrystals

Eyal Yoskovitz; Dan Oron; Itzhak Shweky; Uri Banin

doi:10.1021/jp8043253

Back

Apertureless Near-Field Distance-Dependent Lifetime Imaging and Spectroscopy of Semiconductor Nanocrystals

Journal article

Peer reviewed

Apertureless Near-Field Distance-Dependent Lifetime Imaging and Spectroscopy of Semiconductor Nanocrystals

Eyal Yoskovitz, Dan Oron, Itzhak Shweky and Uri Banin

Journal of Physical Chemistry C, Vol.112(42), pp.16306-16311

23/Oct/2008

DOI: https://doi.org/10.1021/jp8043253

Files and links (1)

url

https://doi.org/10.1021/jp8043253View

Published (Version of record) Restricted

Abstract

Apertureless near-field scanning optical microscopy, along with time-resolving capabilities, is used to produce optical imaging and spectroscopy measurements of single-semiconductor nanocrystals, in correlation with the AFM topography scan. The strongly distance-dependent energy transfer between the excited particle and silicon or metallic-coated AFM tips provides a contrast mechanism for subdiffraction-limited optical imaging. Fluorescence lifetime optical images show excellent contrast, sharpness, sensitivity, and resolution equivalent to that of the AFM topography images (sub 20 nm) and significantly improved over fluorescence intensity images. The sharper resolution of lifetime images is consistent with model predictions of energy transfer between an emitting dipole and a dielectric surface. Lifetime images also enable resolving multiple emitters located in the excitation spot. The comprehensive time and distance dependent data is used to study the imaging mechanism and the properties of silicon tips and platinum-coated tips as energy acceptors and quenchers. The findings provide a basis for use of lifetime imaging, in conjunction with apertureless near field microscopy, for simultaneous high-resolution topography and optical imaging.

Details

Title: Apertureless Near-Field Distance-Dependent Lifetime Imaging and Spectroscopy of Semiconductor Nanocrystals
Creators: Eyal Yoskovitz (null)
Dan Oron (null) - 972WIS_INST___89
Itzhak Shweky (null)
Uri Banin (null)
Resource Type: Journal article
Publication Details: Journal of Physical Chemistry C, Vol.112(42), pp.16306-16311; 23/Oct/2008
Number of pages: 6
Language: English
DOI: https://doi.org/10.1021/jp8043253
Grant note: This work was supported in part by the Israel Science Foundation (grant number 924/04). Partial support of the Farkas Center for Light-Induced Processes, supported by the Minerva Gesellschaft für die Forshung GmbH, Munchen.
Record Identifier: 993262160103596

Metrics

5 Record Views